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IEC 60747-16-10 : 1.0 SEMICONDUCTOR DEVICES - PART 16-10: TECHNOLOGY SCHEDULE (TAS) FOR MONOLITHIC MICROWAVE INTEGRATED CIRCUITS International Electrotechnical Committee
IEC 60747-16-1 : 1.2 SEMICONDUCTOR DEVICES - PART 16-1: MICROWAVE INTEGRATED CIRCUITS - AMPLIFIERS International Electrotechnical Committee
IEC 60747-15 : 2.0 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES International Electrotechnical Committee
IEC 60747-14-5 : 1.0 SEMICONDUCTOR DEVICES - PART 14-5: SEMICONDUCTOR SENSORS - PN-JUNCTION SEMICONDUCTOR TEMPERATURE SENSOR International Electrotechnical Committee
IEC 60747-14-4 : 1.0 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 14-4: SEMICONDUCTOR ACCELEROMETERS International Electrotechnical Committee
IEC 60747-14-3 : 2.0 SEMICONDUCTOR DEVICES - PART 14-3: SEMICONDUCTOR SENSORS - PRESSURE SENSORS International Electrotechnical Committee
IEC 60747-14-2 : 1.0 SEMICONDUCTOR DEVICES - PART 14-2: SEMICONDUCTOR SENSORS - HALL ELEMENTS International Electrotechnical Committee
IEC 60747-14-1 : 2.0 SEMICONDUCTOR DEVICES - PART 14-1: SEMICONDUCTOR SENSORS - GENERIC SPECIFICATION FOR SENSORS International Electrotechnical Committee
IEC 60747-1 : 2.1 SEMICONDUCTOR DEVICES - PART 1: GENERAL International Electrotechnical Committee
IEC 60746-5 : 1.0 EXPRESSION OF PERFORMANCE OF ELECTROCHEMICAL ANALYZERS - OXIDATION REDUCTION POTENTIAL OR REDOX POTENTIAL International Electrotechnical Committee
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