IEC 60747-15 : 2.0
IEC 60747-15 : 2.0
SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES
International Electrotechnical Committee
SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES
International Electrotechnical Committee
FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Letter symbols<br>5 Essential ratings (limiting values) and characteristics<br>6 Measurement methods<br>7 Acceptance and reliability<br>Annex A (informative) - Test method of peak case <br> non-rupture current<br>Annex B (informative) - Measuring method of the thickness <br> of thermal compound paste<br>Bibliography
Describes the requirements for isolated power semiconductor devices excluding devices with incorporated control circuits.
Document Type | Standard |
Status | Current |
Publisher | International Electrotechnical Committee |
Committee | TC 47 |