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IEC 60747-15 : 2.0

IEC 60747-15 : 2.0

SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES

International Electrotechnical Committee

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Table of Contents

FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Letter symbols<br>5 Essential ratings (limiting values) and characteristics<br>6 Measurement methods<br>7 Acceptance and reliability<br>Annex A (informative) - Test method of peak case <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;non-rupture current<br>Annex B (informative) - Measuring method of the thickness <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;of thermal compound paste<br>Bibliography

Abstract

Describes the requirements for isolated power semiconductor devices excluding devices with incorporated control circuits.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 47

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