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IEC 60754-2 : 2.0 TEST ON GASES EVOLVED DURING COMBUSTION OF MATERIALS FROM CABLES - PART 2: DETERMINATION OF ACIDITY (BY PH MEASUREMENT) AND CONDUCTIVITY International Electrotechnical Committee
IEC 60754-1 : 3.0 : 2011 TEST ON GASES EVOLVED DURING COMBUSTION OF MATERIALS FROM CABLES - PART 1: DETERMINATION OF THE HALOGEN ACID GAS CONTENT International Electrotechnical Committee
IEC 60751 : 2.0 INDUSTRIAL PLATINUM RESISTANCE THERMOMETERS AND PLATINUM TEMPERATURE SENSORS International Electrotechnical Committee
IEC 60749-9 : 2.0 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 9: PERMANENCE OF MARKING International Electrotechnical Committee
IEC 60749-8 : 1.0 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 8: SEALING International Electrotechnical Committee
IEC 60749-7 : 2.0 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 7: INTERNAL MOISTURE CONTENT MEASUREMENT AND THE ANALYSIS OF OTHER RESIDUAL GASES International Electrotechnical Committee
IEC 60749-6 : 2.0 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 6: STORAGE AT HIGH TEMPERATURE International Electrotechnical Committee
IEC 60749-5 Ed. 3.0 b:2023 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test standard by International Electrotechnical...
IEC 60749-5 : 2.0 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 5: STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST International Electrotechnical Committee
IEC 60749-43 : 1ED 2017 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 43: GUIDELINES FOR IC RELIABILITY QUALIFICATION PLANS International Electrotechnical Committee
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