IEC 60749-6 : 2.0
IEC 60749-6 : 2.0
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 6: STORAGE AT HIGH TEMPERATURE
International Electrotechnical Committee
Specials
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IEC 60243-1 : 3.0
$78.00 (-60%) $31.20
Table of Contents
FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Test apparatus<br>5 Procedure<br>6 Summary<br>Bibliography
Abstract
Aims to test and determine the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |
| Supersedes |
|
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