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  DIN 50456-3

  DIN 50456-3 Characterization of encapsulating compounds for electronic components used in semiconductor technology - Part 3: Determination of cationic impurities standard by

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  DIN 50455-2

  DIN 50455-2 Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists standard by

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  DIN 50455-1

  DIN 50455-1 Testing of materials for semiconductor technology - Methods for characterizing photoresists - Part 1: Determination of coating thickness with optical methods standard by

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  DIN 50453-2

  DIN 50453-2 Testing of materials for semiconductor technology; determination of etch rates of etching mixtures; silicium-dioxid coating; optical method standard by Deutsches...

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  DIN 50453-1

  DIN 50453-1 Testing of materials for semiconductor technology; determination of etch rates of etching mixtures; silicium monocrystals; gravimetric method standard by Deutsches...

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  DIN 50452-3

  DIN 50452-3 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 3: Calibration of optical particle counters standard by

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  DIN 50452-2

  DIN 50452-2 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 2: Determination of particles by optical particle counters standard by

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  DIN 50452-1

  DIN 50452-1 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles standard by

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  DIN 50451-7 - DRAFT...

  DIN 50451-7 - DRAFT [ Withdrawn ] Draft Document - Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric...

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  DIN 50451-7 - DRAFT

  DIN 50451-7 - DRAFT Draft Document - Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric acid by ICP-MS

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