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IEC 60748-1 : 2.0 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 1: GENERAL International Electrotechnical Committee
IEC 60747-9 : 2.0 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 9: INSULATED-GATE BIPOLAR TRANSISTORS (IGBTS) International Electrotechnical Committee
IEC 60747-8 : 3.0 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 8: FIELD-EFFECT TRANSISTORS International Electrotechnical Committee
IEC 60747-7 : 3.0 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 7: BIPOLAR TRANSISTORS International Electrotechnical Committee
IEC 60747-6 : 3.0 SEMICONDUCTOR DEVICES - PART 6: DISCRETE DEVICES - THYRISTORS International Electrotechnical Committee
IEC 60747-5-7 : 1ED 2016 SEMICONDUCTOR DEVICES - PART 5-7: OPTOELECTRONIC DEVICES - PHOTODIODES AND PHOTOTRANSISTORS International Electrotechnical Committee
IEC 60747-5-6 : 1ED 2016 SEMICONDUCTOR DEVICES - PART 5-6: OPTOELECTRONIC DEVICES - LIGHT EMITTING DIODES International Electrotechnical Committee
IEC 60747-5-5 : 1.1 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-5: OPTOELECTRONIC DEVICES - PHOTOCOUPLERS International Electrotechnical Committee
IEC 60747-5-4 : 1.0 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-4: OPTOELECTRONIC DEVICES - SEMICONDUCTOR LASERS International Electrotechnical Committee
IEC 60747-5-16 Ed. 1.0 en:2023 Semiconductor devices – Part 5-16: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
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