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IEC 60749-14 : 1.0 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 14: ROBUSTNESS OF TERMINATIONS (LEAD INTEGRITY) International Electrotechnical Committee
IEC 60749-13 : 2.0 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE International Electrotechnical Committee
IEC 60749-12 : 2.0 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 12: VIBRATION, VARIABLE FREQUENCY International Electrotechnical Committee
IEC 60749-11 : 1.0 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 11: RAPID CHANGE OF TEMPERATURE - TWO-FLUID-BATH METHOD International Electrotechnical Committee
IEC 60749-10 : 1.0 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 10: MECHANICAL SHOCK International Electrotechnical Committee
IEC 60749-1 : 1.0 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 1: GENERAL International Electrotechnical Committee
IEC 60748-5 : 1.0 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - SEMICUSTOM INTEGRATED CIRCUITS International Electrotechnical Committee
IEC 60748-4-3 : 1.0 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 4-3: INTERFACE INTEGRATED CIRCUITS - DYNAMIC CRITERIA FOR ANALOGUE-DIGITAL CONVERTERS (ADC) International Electrotechnical Committee
IEC 60748-4-2 : 1.0 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - INTERFACE INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR LINEAR ANALOGUE TO DIGITAL CONVERTORS (ADC) International Electrotechnical Committee ...
IEC 60748-4-1 : 1.0 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - INTERFACE INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR LINEAR DIGITAL-TO-ANALOGUE CONVERTERS (DAC) International Electrotechnical Committee ...
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