IECThere are 7584 products.

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  IEC 62053-11 : 1.1

  IEC 62053-11 : 1.1 ELECTRICITY METERING EQUIPMENT (A.C.) - PARTICULAR REQUIREMENTS - PART 11: ELECTROMECHANICAL METERS FOR ACTIVE ENERGY (CLASSES 0,5, 1 AND 2) International Electrotechnical Committee

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  IEC 62052-31 : 1ED 2015

  IEC 62052-31 : 1ED 2015 ELECTRICITY METERING EQUIPMENT (AC) - GENERAL REQUIREMENTS, TESTS AND TEST CONDITIONS - PART 31: PRODUCT SAFETY REQUIREMENTS AND TESTS International Electrotechnical Committee

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  IEC 62052-21 : 1.1

  IEC 62052-21 : 1.1 ELECTRICITY METERING EQUIPMENT (A.C.) - GENERAL REQUIREMENTS, TESTS AND TEST CONDITIONS - PART 21: TARIFF AND LOAD CONTROL EQUIPMENT International Electrotechnical Committee

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  IEC 62052-11 : 1.1

  IEC 62052-11 : 1.1 ELECTRICITY METERING EQUIPMENT (A.C.) - GENERAL REQUIREMENTS, TESTS AND TEST CONDITIONS - PART 11: METERING EQUIPMENT International Electrotechnical Committee

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  IEC 62047-9 : 1.0

  IEC 62047-9 : 1.0 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 9: WAFER TO WAFER BONDING STRENGTH MEASUREMENT FOR MEMS International Electrotechnical Committee

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  IEC 62047-8 : 1.0

  IEC 62047-8 : 1.0 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 8: STRIP BENDING TEST METHOD FOR TENSILE PROPERTY MEASUREMENT OF THIN FILMS International Electrotechnical Committee

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  IEC 62047-7 : 1.0

  IEC 62047-7 : 1.0 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION International Electrotechnical Committee

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  IEC 62047-6 : 1.0

  IEC 62047-6 : 1.0 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 6: AXIAL FATIGUE TESTING METHODS OF THIN FILM MATERIALS International Electrotechnical Committee

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  IEC 62047-5 : 1.0

  IEC 62047-5 : 1.0 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 5: RF MEMS SWITCHES International Electrotechnical Committee

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  IEC 62047-48 Ed. 1.0 En:2024

  IEC 62047-48 Ed. 1.0 En:2024 Semiconductor devices – Micro-electromechanical devices – Part 48: Test method for determining solution concentration by optical absorption using MEMS fluidic device standard by

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