IECThere are 7584 products.

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  IEC 62132-8 : 1.0

  IEC 62132-8 : 1.0 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 8: MEASUREMENT OF RADIATED IMMUNITY - IC STRIPLINE METHOD International Electrotechnical Committee

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  IEC 62132-5 : 1.0

  IEC 62132-5 : 1.0 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY, 150 KHZ TO 1 GHZ - PART 5: WORKBENCH FARADAY CAGE METHOD International Electrotechnical Committee

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  IEC 62132-4 : 1.0

  IEC 62132-4 : 1.0 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY 150 KHZ TO 1 GHZ - PART 4: DIRECT RF POWER INJECTION METHOD International Electrotechnical Committee

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  IEC 62132-3 : 1.0

  IEC 62132-3 : 1.0 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY, 150 KHZ TO 1 GHZ - PART 3: BULK CURRENT INJECTION (BCI) METHOD International Electrotechnical Committee

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  IEC 62132-2 : 1.0

  IEC 62132-2 : 1.0 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 2: MEASUREMENT OF RADIATED IMMUNITY - TEM CELL AND WIDEBAND TEM CELL METHOD International Electrotechnical Committee

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  IEC 62132-1 : 2.0

  IEC 62132-1 : 2.0 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 1: GENERAL CONDITIONS AND DEFINITIONS International Electrotechnical Committee

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  IEC 62129-2 : 1.0

  IEC 62129-2 : 1.0 CALIBRATION OF WAVELENGTH/OPTICAL FREQUENCY MEASUREMENT INSTRUMENTS - PART 2: MICHELSON INTERFEROMETER SINGLE WAVELENGTH METERS International Electrotechnical Committee

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  IEC 62129-1 : 1ED 2016

  IEC 62129-1 : 1ED 2016 CALIBRATION OF WAVELENGTH/OPTICAL FREQUENCY MEASUREMENT INSTRUMENTS - PART 1: OPTICAL SPECTRUM ANALYZERS International Electrotechnical Committee

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  IEC 62128-3 : 1ED 2013

  IEC 62128-3 : 1ED 2013 RAILWAY APPLICATIONS - FIXED INSTALLATIONS - ELECTRICAL SAFETY, EARTHING AND THE RETURN CIRCUIT - PART 3: MUTUAL INTERACTION OF A.C. AND D.C. TRACTION SYSTEMS International Electrotechnical Committee ...

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  IEC 62128-2 : 2.0

  IEC 62128-2 : 2.0 RAILWAY APPLICATIONS - FIXED INSTALLATIONS - ELECTRICAL SAFETY, EARTHING AND THE RETURN CIRCUIT - PART 2: PROVISIONS AGAINST THE EFFECTS OF STRAY CURRENTS CAUSED BY D.C. TRACTION SYSTEMS International Electrotechnical...

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