Specials

All specials

IEC 61124 : 3.0

IEC 61124 : 3.0

RELIABILITY TESTING - COMPLIANCE TESTS FOR CONSTANT FAILURE RATE AND CONSTANT FAILURE INTENSITY

International Electrotechnical Committee

More details

Download

PDF AVAILABLE FORMATS IMMEDIATE DOWNLOAD
$31.20

$78.00

(price reduced by 60 %)

Table of Contents

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations
   and symbols
4 General requirements and area of application
5 General test procedure
6 Sequential test plans
7 Fixed time/failure terminated test
   plans - Fixed duration test plans
8 Design of alternative time/failure terminated
   test plans
9 Calendar time/failure terminated test plans for
   non-replaced items
10 Combined test plans
11 Performing the test
12 Presentation of results
Annex A (normative) - Tables and graphs for sequential
        test plans
Annex B (normative) - Graphs for fixed time/failure
        terminated test plans
Annex C (normative) - Graphs for alternative time/failure
        terminated test plans
Annex D (normative) - Tables and graphs for combined
        test plans and additional sequential test plans
Annex E (informative) - Examples and mathematical
        references for sequential test plans
Annex F (informative) - Design of sequential test plans
        using a common spreadsheet program
Annex G (informative) - Examples and mathematical
        references for fixed time/failure terminated test
        plans - Fixed duration test plans
Annex H (informative) - Design of fixed duration
        time/failure terminated test plans using
        a spreadsheet program
Annex I (informative) - Examples and mathematical
        references for the design of alternative
        time/failure terminated test plans
Annex J (informative) - Examples and mathematical
        references for the calendar time terminated
        test plans
Annex K (informative) - Derivation and mathematical
        reference for the optimized test plans of
        GOST R 27 402
Bibliography

Abstract

Provides a number of optimized test plans, the corresponding operating characteristic curves and expected test times.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 56

Contact us