SEMICONDUCTOR DEVICES. INTEGRATED CIRCUITS - INTERNAL VISUAL EXAMINATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS
International Electrotechnical Committee
FOREWORD<br>Clause<br>1 Scope and object<br>2 Apparatus<br>3 Procedure for integrated circuits<br> 3.0 Introduction<br> 3.1 Test conditions<br> 3.2 Specified conditions<br>Figures
This publication also bears the number QC 790101 which is the specification number in the IEC Quality Assessment System for Electronic Components (IECQ).
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | SC 47A |
| Supersedes |
|
