IEC 62007-2 : 2.0

SEMICONDUCTOR OPTOELECTRONIC DEVICES FOR FIBRE OPTIC SYSTEM APPLICATIONS - PART 2: MEASURING METHODS

International Electrotechnical Committee

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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviations
  3.1 Terms and definitions
  3.2 Abbreviations
4 Measuring methods for photoemitters
  4.1 Outline of the measuring methods
  4.2 Radiant power or forward current of LEDs and LDs with
       or without optical fibre pigtails
  4.3 Small signal cut-off frequency (f[c]) of LEDs and LDs
       with or without optical fibre pigtails
  4.4 Threshold current of LDs with or without optical fibre
       pigtails
  4.5 Relative intensity noise of LEDs and LDs with or without
       optical fibre pigtails
  4.6 S[11] parameter of LEDs, LDs and LD modules with or
       without optical fibre pigtails
  4.7 Tracking error for LD modules with optical fibre pigtails,
       with or without cooler
  4.8 Spectral linewidth of LDs with or without optical fibre
       pigtails
  4.9 Modulation current at 1 dB efficacy compression
       (I[F (1 dB)]) of LEDs
  4.10 Differential efficiency (eta[d]) of a LD with or without
       pigtail and an LD module
  4.11 Differential (forward) resistance r[d] of an LD with or
       without pigtail
5 Measuring methods for receivers
  5.1 Outline of the measuring methods
  5.2 Noise of a PIN photodiode
  5.3 Excess noise factor of an APD with or without optical
       fibre pigtails
  5.4 Small-signal cut-off frequency of a photodiode with or
       without optical fibre pigtails
  5.5 Multiplication factor of an APD with or without optical
       fibre pigtails
  5.6 Responsivity of a PIN-TIA module
  5.7 Frequency response flatness (delta S/S) of a PIN-TIA
       module
  5.8 Output noise power (spectral) density (P[no,lambda]) of a
       PIN-TIA module
  5.9 Low frequency output noise power (spectral) density
       (P[no,lambda,LF]) and corner frequency (f[cor]) of
       a PIN-TIA module
  5.10 Minimum detectable power of PIN-TIA module
Bibliography

Abstract

Specifies the measuring methods applicable to the semiconductor optoelectronic devices to be used in the field of fibre optic digital communication systems and subsystems.