IEC 60749-17 : 1.0
IEC 60749-17 : 1.0
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION
International Electrotechnical Committee
Specials
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IEC 61347-2-13 : 2.1
$78.00 (-60%) $31.20
Table of Contents
FOREWORD<br>1 Scope and object<br>2 Test apparatus<br>3 Procedure<br>4 Summary
Abstract
Defines the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |
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