INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 3: MEASUREMENT OF RADIATED EMISSIONS - SURFACE SCAN METHOD
International Electrotechnical Committee
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviations
4 General
5 Test conditions
6 Test equipment
7 Test setup
8 Test procedure
9 Test report
Annex A (normative) - Calibration of near-field probes
Annex B (informative) - Discrete electric and magnetic
field probes
Annex C (informative) - Combined electric and magnetic
field probe example
Annex D (informative) - Coordinate systems
Bibliography
Gives a test procedure which defines an evaluation method for the near electric, magnetic or electromagnetic field components at or near the surface of an integrated circuit (IC).
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |
