INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 2: MEASUREMENT OF RADIATED EMISSIONS - TEM CELL AND WIDEBAND TEM CELL METHOD
International Electrotechnical Committee
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
5.1 General
5.2 Supply voltage
5.3 Frequency range
6 Test equipment
6.1 General
6.2 Shielding
6.3 RF measuring instrument
6.4 Preamplifier
6.5 TEM cell
6.6 Wideband TEM/GTEM cell
6.7 50-Ohm termination
6.8 System gain
7 Test set-up
7.1 General
7.2 Test configuration
7.3 Test PCB
8 Test procedure
8.1 General
8.2 Ambient measurement
8.3 DUT operational check
8.4 DUT emissions measurement
9 Test report
9.1 General
9.2 Measurement conditions
10 IC emissions reference levels
Annex A (informative) Example calibration & set-up
verification sheet
Annex B (informative) TEM cell and wideband TEM cell
descriptions
B.1 TEM cell
B.2 Wideband GTEM cell
Annex C (informative) Calculation of dipole moment from
measured data
C.1 General
C.2 Dipole moment calculation
Annex D (informative) Specification of emissions data
D.1 General
D.2 Specification of emission levels
D.3 Presentation of results
D.4 Examples
Bibliography
Defines a method for measuring the electromagnetic radiation from an integrated circuit (IC).
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |
