IEC 60068-2-82 : 1.0

ENVIRONMENTAL TESTING - PART 2-82: TESTS - TEST XW[1]: WHISKER TEST METHODS FOR ELECTRONIC AND ELECTRIC COMPONENTS

International Electrotechnical Committee

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FOREWORD 1 Scope 2 Normative references 3 Terms and definitions 4 Test equipment   4.1 Desiccator   4.2 Humidity chamber   4.3 Thermal cycling chamber   4.4 Optical microscope   4.5 Scanning electron microscope microscopy   4.6 Fixing jig 5 Preparation for test   5.1 General   5.2 Selection of test methods   5.3 Storage conditions prior to testing   5.4 Handling of the specimen   5.5 Preconditioning by heat treatment   5.6 Specimen preparation by leads forming 6 Test condition   6.1 Ambient test   6.2 Damp heat test   6.3 Temperature cycling test 7 Test schedule   7.1 Procedure for test method selection   7.2 Initial measurement   7.3 Test   7.4 Recovery   7.5 Intermediate or final assessment 8 Information to be given in the relevant specification 9 Minimum requirements for a test report Annex A (normative) Measurement of the whisker length Annex B (informative) Examples of whiskers Annex C (informative) Guidance on the sample lots and                       test schedules Annex D (informative) Guidance on acceptance criteria Annex E (informative) Background on whisker growth Annex F (informative) Background on ambient test Annex G (informative) Background on damp heat test Annex H (informative) Background on temperature                       cycling test Bibliography