IEC 61988-2-3 : 1.0

IEC 61988-2-3 : 1.0

PLASMA DISPLAY PANELS - PART 2-3: MEASURING METHODS - IMAGE QUALITY: DEFECTS AND DEGRADATION

International Electrotechnical Committee

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Table of Contents

FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Standard measuring conditions<br>&nbsp;&nbsp;4.1 Environmental conditions<br>&nbsp;&nbsp;4.2 Lighting conditions<br>&nbsp;&nbsp;4.3 Set-up conditions<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;4.3.1 Adjustment of PDP modules<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;4.3.2 Warm-up condition of PDP modules<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;4.3.3 Conditions of measuring and driving equipment<br>5 Measuring methods<br>&nbsp;&nbsp;5.1 Cell defects<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.1.1 Purpose<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.1.2 Measuring equipment<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.1.3 Measuring layout<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.1.4 Division of display zone<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.1.5 Classification of cell defects<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.1.6 Luminance levels of defective cells<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.1.7 Measuring procedure<br>&nbsp;&nbsp;5.2 Image sticking<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.2.1 Purpose<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.2.2 Measuring equipment<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.2.3 Specification of image sticking<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.2.4 Measuring procedure<br>&nbsp;&nbsp;5.3 Luminance lifetime<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.3.1 Purpose<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.3.2 Measuring equipment<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.3.3 Measuring procedure<br>Annex A (informative) Luminance lifetime estimation<br>Bibliography

Abstract

Describes the measuring methods for defects and degradation of colour plasma display (PDP) module in the following areas: a) cell defects; b) image sticking; c) luminance lifetime.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 110

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