IEC 62860 : 1ED 2013

IEC 62860 : 1ED 2013

TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTORS AND MATERIALS

International Electrotechnical Committee

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Table of Contents

1. Overview
2. Definitions, acronyms, and abbreviations
3. Standard OFET characterization procedures
Annex A (informative) - Bibliography
Annex B (informative) - IEEE List of Participants

Abstract

Specifies a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 113

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