IEC 62860 : 1ED 2013
IEC 62860 : 1ED 2013
TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTORS AND MATERIALS
International Electrotechnical Committee
TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTORS AND MATERIALS
International Electrotechnical Committee
1. Overview
2. Definitions, acronyms, and abbreviations
3. Standard OFET characterization procedures
Annex A (informative) - Bibliography
Annex B (informative) - IEEE List of Participants
Specifies a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
Document Type | Standard |
Status | Current |
Publisher | International Electrotechnical Committee |
Committee | TC 113 |