IEC 62860-1 : 1ED 2013
IEC 62860-1 : 1ED 2013
TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTOR-BASED RING OSCILLATORS
International Electrotechnical Committee
TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTOR-BASED RING OSCILLATORS
International Electrotechnical Committee
1. Overview
2. Definitions, abbreviations and acronyms
3. Standard ring oscillator characterization
procedures
Annex A (informative) - Bibliography
Annex B (informative) - IEEE List of Participants
Specifies a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
Document Type | Standard |
Status | Current |
Publisher | International Electrotechnical Committee |
Committee | TC 113 |