IEC 62860-1 : 1ED 2013

IEC 62860-1 : 1ED 2013

TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTOR-BASED RING OSCILLATORS

International Electrotechnical Committee

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Table of Contents

1. Overview
2. Definitions, abbreviations and acronyms
3. Standard ring oscillator characterization
   procedures
Annex A (informative) - Bibliography
Annex B (informative) - IEEE List of Participants

Abstract

Specifies a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 113

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