IEC TR 63133 : 1ED 2017

Table of Contents

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
4 Ageing level
Bibliography

Abstract

Describes a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 47